HS Code 903190400000
- - - Parts and accessories for electronic beams microscopes fitted with instruments of a kind used specially for handling and transporting wafers and photomasks semiconductors
- - - أجزاء ولوازم ميكروسكوبات (مجاهر) الحزم الإليكترونية مزودة بأجهزة معدة خصيصا لمناولة ونقل الأقراص الرقيقة والشبيكات من أشباه الموصلات
Customs Duty
Exempted
معفاة
Import Status
allowed
Details
- HS Code
- 903190400000
- Chapter
- 90 —
- Heading
- 9031
- Subheading
- 903190
Related HS Codes (Heading 9031)
| HS Code | Description | Duty |
|---|---|---|
| 903110000001 | Centrifugal balancing machines designed for balancing flexible rotors having a length of 600 mm or more (capable of balancing speed of revolution greater than 5000 rpm) | 5 % |
| 903110000002 | Centrifugal balancing machines designed for balancing hollow cylindrical rotor components (having capability of from 0.9 to 23 kg) | 5 % |
| 903110009999 | Other | 5 % |
| 903120000000 | - Test benches | 5 % |
| 903141000000 | -- For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Exempted |
| 903149100000 | - - - Optical instruments for measuring particle surface pollution on semiconductor wafers | Exempted |
| 903149200000 | - - -Measuring instruments for dimensional inspection computer controlled or numerically controlled having only two axes and having a maximum permissible error of length measurement along any axis (one dimensional) | Exempted |
| 903149300000 | - - -Measuring systems containing a laser (with a resolution over their full scale of 0.1 µm or better and capable of maintaining for at least 12 h) | Exempted |
| 903149900000 | - - - Other | Exempted |
| 903180100000 | - - - Appliances for checking and adjusting motor vehicle engines | 5 % |
| 903180200000 | - - - Electronic beams microscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and rectiles | Exempted |
| 903180300000 | - - -Electrodynamic vibration test systems employing feedback or closed loop control techniques and incorporating a digital control unit | Exempted |
| 903180400000 | - - -Velocity interferometers for measuring velocities exceeding 1 km/s during time intervals of less than 10 µs | Exempted |
| 903180900001 | Linear displacement measuring instruments containing non-contact type measuring systems (with a resolution equal to or better than 0.2 µm) | 5 % |
| 903180900002 | Linear displacement measuring instruments for linear variable differential transformer systems with an operating range up to 5 mm | 5 % |
| 903180900003 | Angular displacement measuring systems for angular displacement having an angular position deviation equal to or less than 0.00025°. | 5 % |
| 903180900004 | Measuring systems for results of measuring simultaneous linear-angular inspection for semi shells systems (having measurement uncertainty along any linear axis equal to or less than 3.5 µm per 5 mm and angular position deviation equal to or less than 0.02°) | 5 % |
| 903180909999 | Other | 5 % |
| 903190100000 | - - - Parts and accessories for inspecting semiconductor wafers optical instruments or devices or for inspecting semiconductor masks, photomasks or reticles used in the manufacturing of semiconductor devices | Exempted |
| 903190200000 | - - - Parts and accessories for stroboscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and reticles | Exempted |
Data source: General Administration of Customs (GCC CET). Duty rates shown are for informational purposes only and do not include VAT, excise taxes, or preferential rates under trade agreements. Full disclaimer.