Kuwait Customs Tariff for HS Code 903190300000
- - - Parts and accessories for measuring particle surface pollution optical instruments on semiconductor wafers
- - - أجزاء ولوازم الأجهزة البصرية لقياس التلوث السطحي الدقائقي على الأقراص الرقيقة لأشباه الموصلات
Schedule duty or measure: 0 %.
source checked .
Kuwait Public Authority for Industry — GCC tariff workbook, row 19689.
Products listed under this code (1 source entries)
- - - - Parts and accessories for measuring particle surface pollution optical instruments on semiconductor wafers
Historical GCC reference published by Kuwait Public Authority for Industry, not a consolidated current Kuwait duty. The workbook is labelled 2022; the authority links it for the 2025 code transition. Neither label establishes a 2026 rate or a line-level effective date. Later amendments, national exceptions, trade remedies, preferential origin and import permissions require separate confirmation.
Amendment history and additional sources
Kuwait PAI official tariff download page
Kuwait PAI notice — 12-digit codes for industrial exemption certificates from 1 January 2025
Direct HS code answer for Kuwait
Kuwait HS Code 903190300000: 0 %
The cited published schedule reports 0 % for - - - Parts and accessories for measuring particle surface pollution optical instruments on semiconductor wafers.Source status: not assessed. Verify the exact national tariff line, origin treatment, taxes, restrictions, and current customs guidance before using this information in a declaration.
Customs tariff summary
- Country
- Kuwait
- HS / tariff code
- 903190300000
- Description
- - - - Parts and accessories for measuring particle surface pollution optical instruments on semiconductor wafers
- Chapter
- 90 —
- Heading
- 9031
- Subheading
- 903190
- Reference duty value
- 0 %
- VAT / tax
- Check local VAT and excise rules for the import destination.
- Unit / basis
- Not listed in this tariff line
- Source / vintage
- Kuwait Public Authority for Industry — GCC tariff workbook, row 19689
Customs Duty
0 %
Import permission
not assessed
Import planning
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Details
- HS Code
- 903190300000
- Chapter
- 90 —
- Heading
- 9031
- Subheading
- 903190
Compare HS code 903190300000 across GCC countries
Each destination shows its own source label. Oman uses its national schedule; Qatar and UAE entries may cite their separately published references and unresolved exceptions. Other entries retain the historical GCC reference. National codes, duty notes, restrictions and tax treatment can differ; verify with the destination customs authority.
Related HS Codes (Heading 9031)
| HS Code | Description | Duty |
|---|---|---|
| 903110000001 | Centrifugal balancing machines designed for balancing flexible rotors having a length of 600 mm or more (capable of balancing speed of revolution greater than 5000 rpm) | 5 %Historical GCC reference · not nationally verified |
| 903110000002 | Centrifugal balancing machines designed for balancing hollow cylindrical rotor components (having capability of from 0.9 to 23 kg) | 5 %Historical GCC reference · not nationally verified |
| 903110009999 | Other | 5 %Historical GCC reference · not nationally verified |
| 903120000000 | - Test benches | 5 %Kuwait PAI published GCC reference (HS 2022) |
| 903141000000 | -- For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | 0 %Kuwait PAI published GCC reference (HS 2022) |
| 903149100000 | - - - Optical instruments for measuring particle surface pollution on semiconductor wafers | 0 %Kuwait PAI published GCC reference (HS 2022) |
| 903149200000 | - - -Measuring instruments for dimensional inspection computer controlled or numerically controlled having only two axes and having a maximum permissible error of length measurement along any axis (one dimensional) | ExemptedHistorical GCC reference · not nationally verified |
| 903149300000 | - - -Measuring systems containing a laser (with a resolution over their full scale of 0.1 µm or better and capable of maintaining for at least 12 h) | ExemptedHistorical GCC reference · not nationally verified |
| 903149900000 | - - - Other | 0 %Kuwait PAI published GCC reference (HS 2022) |
| 903180100000 | - - - Appliances for checking and adjusting motor vehicle engines | 5 %Kuwait PAI published GCC reference (HS 2022) |
| 903180200000 | - - - Electronic beams microscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and rectiles | 0 %Kuwait PAI published GCC reference (HS 2022) |
| 903180300000 | - - -Electrodynamic vibration test systems employing feedback or closed loop control techniques and incorporating a digital control unit | ExemptedHistorical GCC reference · not nationally verified |
| 903180400000 | - - -Velocity interferometers for measuring velocities exceeding 1 km/s during time intervals of less than 10 µs | ExemptedHistorical GCC reference · not nationally verified |
| 903180900001 | Linear displacement measuring instruments containing non-contact type measuring systems (with a resolution equal to or better than 0.2 µm) | 5 %Historical GCC reference · not nationally verified |
| 903180900002 | Linear displacement measuring instruments for linear variable differential transformer systems with an operating range up to 5 mm | 5 %Historical GCC reference · not nationally verified |
| 903180900003 | Angular displacement measuring systems for angular displacement having an angular position deviation equal to or less than 0.00025°. | 5 %Historical GCC reference · not nationally verified |
| 903180900004 | Measuring systems for results of measuring simultaneous linear-angular inspection for semi shells systems (having measurement uncertainty along any linear axis equal to or less than 3.5 µm per 5 mm and angular position deviation equal to or less than 0.02°) | 5 %Historical GCC reference · not nationally verified |
| 903180909999 | Other | 5 %Historical GCC reference · not nationally verified |
| 903190100000 | - - - Parts and accessories for inspecting semiconductor wafers optical instruments or devices or for inspecting semiconductor masks, photomasks or reticles used in the manufacturing of semiconductor devices | 0 %Kuwait PAI published GCC reference (HS 2022) |
| 903190200000 | - - - Parts and accessories for stroboscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and reticles | 0 %Kuwait PAI published GCC reference (HS 2022) |
Data source: Kuwait PAI published GCC workbook (HS 2022); historical reference, national amendments not consolidated. Historical reference rates exclude VAT, excise and other national measures. Separate national entries preserve the columns printed by their source; these are not a complete shipment assessment. Full disclaimer.