903082000000
- - لقياس أو فحص الأقراص الرقيقة أو الأدوات من أشباه الموصلات (بما فيها الدوائر المتكاملة)
-- For measuring or checking semiconductor wafers or devices (including integrated circuits)
- Duty or measure — English (as printed)
- Exempted
- Duty or measure — Arabic (as printed)
- معفاة
Source notes and context notes
- Procedure identifiers: 21. Consult the official portal for their full requirements.
- Source Date column (not independently interpreted): 1/1/2007 12:00:00 AM