HS Code 903149300000
- - -Measuring systems containing a laser (with a resolution over their full scale of 0.1 µm or better and capable of maintaining for at least 12 h)
- - - نظم قياس تحتوي على ليزر بدقة وضوح على كامل النطاق (دقة وضوح على كامل النطاق تبلغ 0.1 مايكرومتر أو أقل وتعمل لمدة لا تقل عن 12 ساعة)
Customs Duty
Exempted
معفاة
Import Status
allowed
Details
- HS Code
- 903149300000
- Chapter
- 90 —
- Heading
- 9031
- Subheading
- 903149
- Procedures
- 113
Related HS Codes (Heading 9031)
| HS Code | Description | Duty |
|---|---|---|
| 903110000001 | Centrifugal balancing machines designed for balancing flexible rotors having a length of 600 mm or more (capable of balancing speed of revolution greater than 5000 rpm) | 5 % |
| 903110000002 | Centrifugal balancing machines designed for balancing hollow cylindrical rotor components (having capability of from 0.9 to 23 kg) | 5 % |
| 903110009999 | Other | 5 % |
| 903120000000 | - Test benches | 5 % |
| 903141000000 | -- For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Exempted |
| 903149100000 | - - - Optical instruments for measuring particle surface pollution on semiconductor wafers | Exempted |
| 903149200000 | - - -Measuring instruments for dimensional inspection computer controlled or numerically controlled having only two axes and having a maximum permissible error of length measurement along any axis (one dimensional) | Exempted |
| 903149900000 | - - - Other | Exempted |
| 903180100000 | - - - Appliances for checking and adjusting motor vehicle engines | 5 % |
| 903180200000 | - - - Electronic beams microscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and rectiles | Exempted |
| 903180300000 | - - -Electrodynamic vibration test systems employing feedback or closed loop control techniques and incorporating a digital control unit | Exempted |
| 903180400000 | - - -Velocity interferometers for measuring velocities exceeding 1 km/s during time intervals of less than 10 µs | Exempted |
| 903180900001 | Linear displacement measuring instruments containing non-contact type measuring systems (with a resolution equal to or better than 0.2 µm) | 5 % |
| 903180900002 | Linear displacement measuring instruments for linear variable differential transformer systems with an operating range up to 5 mm | 5 % |
| 903180900003 | Angular displacement measuring systems for angular displacement having an angular position deviation equal to or less than 0.00025°. | 5 % |
| 903180900004 | Measuring systems for results of measuring simultaneous linear-angular inspection for semi shells systems (having measurement uncertainty along any linear axis equal to or less than 3.5 µm per 5 mm and angular position deviation equal to or less than 0.02°) | 5 % |
| 903180909999 | Other | 5 % |
| 903190100000 | - - - Parts and accessories for inspecting semiconductor wafers optical instruments or devices or for inspecting semiconductor masks, photomasks or reticles used in the manufacturing of semiconductor devices | Exempted |
| 903190200000 | - - - Parts and accessories for stroboscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and reticles | Exempted |
| 903190300000 | - - - Parts and accessories for measuring particle surface pollution optical instruments on semiconductor wafers | Exempted |
Data source: ZATCA (Zakat, Tax and Customs Authority). Duty rates shown are for informational purposes only and do not include VAT, excise taxes, or preferential rates under trade agreements. Full disclaimer.