- - - أجهزة بصرية لقياس التلوث السطحي الدقائقي على الأقراص الرقيقة لأشباه الموصلات
19,104 official source entries are searchable. Checked 2026-09-22.
Exact 12-digit rows from the official public export, including hierarchy rows with no duty. Blank cells are not confirmed zero duties. Arabic and English measures, procedure identifiers and the source Date column are preserved. Consult the portal for release procedures, origin, exemptions and other taxes. This export does not calculate a shipment total and is separate from the older site reference.
- - - أجهزة بصرية لقياس التلوث السطحي الدقائقي على الأقراص الرقيقة لأشباه الموصلات
- - - Optical instruments for measuring particle surface pollution on semiconductor wafers
Historical reference for Saudi Arabia
The reference dataset lists a duty value of Exempted for - - - Optical instruments for measuring particle surface pollution on semiconductor wafers.Source status: not prohibited in this source; other restrictions not assessed. Verify the exact national tariff line, origin treatment, taxes, restrictions, and current customs guidance before using this information in a declaration.
Exempted
معفاة
not prohibited in this source; other restrictions not assessed
Import planning
Request a one-page research summary with source checks, landed-cost inputs, and points to verify for HS code 903149100000 in Saudi Arabia.
Each destination shows its own source label. Oman uses its national schedule; Qatar and UAE entries may cite their separately published references and unresolved exceptions. Other entries retain the historical GCC reference. National codes, duty notes, restrictions and tax treatment can differ; verify with the destination customs authority.
| HS Code | Description | Duty |
|---|---|---|
| 903110000001 | Centrifugal balancing machines designed for balancing flexible rotors having a length of 600 mm or more (capable of balancing speed of revolution greater than 5000 rpm) | 5 % |
| 903110000002 | Centrifugal balancing machines designed for balancing hollow cylindrical rotor components (having capability of from 0.9 to 23 kg) | 5 % |
| 903110009999 | Other | 5 % |
| 903120000000 | - Test benches | 5 % |
| 903141000000 | -- For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Exempted |
| 903149200000 | - - -Measuring instruments for dimensional inspection computer controlled or numerically controlled having only two axes and having a maximum permissible error of length measurement along any axis (one dimensional) | Exempted |
| 903149300000 | - - -Measuring systems containing a laser (with a resolution over their full scale of 0.1 µm or better and capable of maintaining for at least 12 h) | Exempted |
| 903149900000 | - - - Other | Exempted |
| 903180100000 | - - - Appliances for checking and adjusting motor vehicle engines | 5 % |
| 903180200000 | - - - Electronic beams microscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and rectiles | Exempted |
| 903180300000 | - - -Electrodynamic vibration test systems employing feedback or closed loop control techniques and incorporating a digital control unit | Exempted |
| 903180400000 | - - -Velocity interferometers for measuring velocities exceeding 1 km/s during time intervals of less than 10 µs | Exempted |
| 903180900001 | Linear displacement measuring instruments containing non-contact type measuring systems (with a resolution equal to or better than 0.2 µm) | 5 % |
| 903180900002 | Linear displacement measuring instruments for linear variable differential transformer systems with an operating range up to 5 mm | 5 % |
| 903180900003 | Angular displacement measuring systems for angular displacement having an angular position deviation equal to or less than 0.00025°. | 5 % |
| 903180900004 | Measuring systems for results of measuring simultaneous linear-angular inspection for semi shells systems (having measurement uncertainty along any linear axis equal to or less than 3.5 µm per 5 mm and angular position deviation equal to or less than 0.02°) | 5 % |
| 903180909999 | Other | 5 % |
| 903190100000 | - - - Parts and accessories for inspecting semiconductor wafers optical instruments or devices or for inspecting semiconductor masks, photomasks or reticles used in the manufacturing of semiconductor devices | Exempted |
| 903190200000 | - - - Parts and accessories for stroboscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and reticles | Exempted |
| 903190300000 | - - - Parts and accessories for measuring particle surface pollution optical instruments on semiconductor wafers | Exempted |
Data source: ZATCA (Zakat, Tax and Customs Authority). Historical reference rates exclude VAT, excise and other national measures. Separate national entries preserve the columns printed by their source; these are not a complete shipment assessment. Full disclaimer.