This directory combines historical reference rows with separately labelled national sources. Read the source title, observation date, printed units and conditions on each entry. National source observations do not establish all measures applicable to a shipment.

Saudi Arabia Customs Tariff for HS Code 903180200000

- - - Electronic beams microscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and rectiles

- - - ميكروسكوبات (مجاهر) الحزم الإليكترونية مزودة بأجهزة معدة خصيصا لمناولة ونقل الأقراص الرقيقة والشبيكات من أشباه الموصلات

Saudi ZATCA integrated customs tariff — official public export

19,104 official source entries are searchable. Checked 2026-09-22.

Exact 12-digit rows from the official public export, including hierarchy rows with no duty. Blank cells are not confirmed zero duties. Arabic and English measures, procedure identifiers and the source Date column are preserved. Consult the portal for release procedures, origin, exemptions and other taxes. This export does not calculate a shipment total and is separate from the older site reference.

Official schedule and source documentation

Official entries matching 903180200000

903180200000

- - - Electronic beams microscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and rectiles

Duty or measure — English (as printed): Exempted
Duty or measure — Arabic (as printed): معفاة

Source notes and context notes

Procedure identifiers: 21. Consult the official portal for their full requirements.
Source Date column (not independently interpreted): 1/1/2007 12:00:00 AM

Official source for this code

Historical reference for Saudi Arabia

Saudi Arabia HS Code 903180200000: Exempted

The reference dataset lists a duty value of Exempted for - - - Electronic beams microscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and rectiles.Source status: not prohibited in this source; other restrictions not assessed. Verify the exact national tariff line, origin treatment, taxes, restrictions, and current customs guidance before using this information in a declaration.

Browse chapter 90 Search parent HS 903180 Request import report

Customs tariff summary

Country: Saudi Arabia
HS / tariff code: 903180200000
Description: - - - Electronic beams microscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and rectiles
Chapter: 90 —
Heading: 9031
Subheading: 903180
Reference duty value: Exempted
VAT / tax: Check local VAT and excise rules for the import destination.
Unit / basis: Not listed in this tariff line
Source / vintage: ZATCA (Zakat, Tax and Customs Authority)

Historical reference duty — see official export above

Exempted

معفاة

Import permission

not prohibited in this source; other restrictions not assessed

Import planning

Need a landed cost report for this HS code?

Request a one-page research summary with source checks, landed-cost inputs, and points to verify for HS code 903180200000 in Saudi Arabia.

Get report

Details

HS Code: 903180200000
Chapter: 90 —
Heading: 9031
Subheading: 903180

Compare HS code 903180200000 across GCC countries

Each destination shows its own source label. Oman uses its national schedule; Qatar and UAE entries may cite their separately published references and unresolved exceptions. Other entries retain the historical GCC reference. National codes, duty notes, restrictions and tax treatment can differ; verify with the destination customs authority.

Saudi ArabiaExact code listed: Exempted United Arab EmiratesExact code listed: 0 %Dubai Customs published reference OmanExact code listed: 0 %Oman national schedule 2026 QatarExact code listed: 0 %Qatar Customs published reference — amendment code checks completed KuwaitExact code listed: 0 %Kuwait PAI published GCC reference (HS 2022)BahrainExact code listed: Exempted

Related HS Codes (Heading 9031)

HS Code	Description	Duty
903110000001	Centrifugal balancing machines designed for balancing flexible rotors having a length of 600 mm or more (capable of balancing speed of revolution greater than 5000 rpm)	5 %
903110000002	Centrifugal balancing machines designed for balancing hollow cylindrical rotor components (having capability of from 0.9 to 23 kg)	5 %
903110009999	Other	5 %
903120000000	- Test benches	5 %
903141000000	-- For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)	Exempted
903149100000	- - - Optical instruments for measuring particle surface pollution on semiconductor wafers	Exempted
903149200000	- - -Measuring instruments for dimensional inspection computer controlled or numerically controlled having only two axes and having a maximum permissible error of length measurement along any axis (one dimensional)	Exempted
903149300000	- - -Measuring systems containing a laser (with a resolution over their full scale of 0.1 µm or better and capable of maintaining for at least 12 h)	Exempted
903149900000	- - - Other	Exempted
903180100000	- - - Appliances for checking and adjusting motor vehicle engines	5 %
903180300000	- - -Electrodynamic vibration test systems employing feedback or closed loop control techniques and incorporating a digital control unit	Exempted
903180400000	- - -Velocity interferometers for measuring velocities exceeding 1 km/s during time intervals of less than 10 µs	Exempted
903180900001	Linear displacement measuring instruments containing non-contact type measuring systems (with a resolution equal to or better than 0.2 µm)	5 %
903180900002	Linear displacement measuring instruments for linear variable differential transformer systems with an operating range up to 5 mm	5 %
903180900003	Angular displacement measuring systems for angular displacement having an angular position deviation equal to or less than 0.00025°.	5 %
903180900004	Measuring systems for results of measuring simultaneous linear-angular inspection for semi shells systems (having measurement uncertainty along any linear axis equal to or less than 3.5 µm per 5 mm and angular position deviation equal to or less than 0.02°)	5 %
903180909999	Other	5 %
903190100000	- - - Parts and accessories for inspecting semiconductor wafers optical instruments or devices or for inspecting semiconductor masks, photomasks or reticles used in the manufacturing of semiconductor devices	Exempted
903190200000	- - - Parts and accessories for stroboscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and reticles	Exempted
903190300000	- - - Parts and accessories for measuring particle surface pollution optical instruments on semiconductor wafers	Exempted

Data source: ZATCA (Zakat, Tax and Customs Authority). Historical reference rates exclude VAT, excise and other national measures. Separate national entries preserve the columns printed by their source; these are not a complete shipment assessment. Full disclaimer.