United Arab Emirates Customs Tariff for HS Code 903190100000
- - - Parts and accessories for inspecting semiconductor wafers optical instruments or devices or for inspecting semiconductor masks, photomasks or reticles used in the manufacturing of semiconductor devices
- - - أجزاء ولوازم الأجهزة البصرية لفحص الأقراص الرقيقة أو الأدوات من أشباه الموصلات أو لفحص الأقنعة أو الأقنعة الضوئية أو الشبيكات المستعملة في صنع الأدوات من أشباه الموصلات
Schedule duty or measure: 0 %.
source checked .
Dubai Customs HSCodeMaster v3.3, worksheet HSCodeMaster, row 12765.
Products listed under this code (1 source entries)
- Parts and accessories of optical instruments and appliances for inspecting semiconductor wafer or devices for inspecting masks, photomasks or reticles used in manufacturing semiconductor devices
Dubai Customs published reference (HSCodeMaster v3.3), not a consolidated current UAE-wide duty. The workbook supplies no line-level effective date. National exceptions, preferential origin, trade remedies, VAT, excise and import permissions are not determined here. The 12-digit transition depends on the declaration flow; Notice 02/2026 continues Phase 1 flexibility for 8-digit codes.
Amendment history and additional sources
Dubai Customs integrated tariff and code correlation download
Dubai Customs Notice 02/2026 — continued Phase 1 flexibility for 8-digit declarations
Direct HS code answer for United Arab Emirates
United Arab Emirates HS Code 903190100000: 0 %
The cited published schedule reports 0 % for - - - Parts and accessories for inspecting semiconductor wafers optical instruments or devices or for inspecting semiconductor masks, photomasks or reticles used in the manufacturing of semiconductor devices.Source status: not assessed. Verify the exact national tariff line, origin treatment, taxes, restrictions, and current customs guidance before using this information in a declaration.
Customs tariff summary
- Country
- United Arab Emirates
- HS / tariff code
- 903190100000
- Description
- - - - Parts and accessories for inspecting semiconductor wafers optical instruments or devices or for inspecting semiconductor masks, photomasks or reticles used in the manufacturing of semiconductor devices
- Chapter
- 90 —
- Heading
- 9031
- Subheading
- 903190
- Reference duty value
- 0 %
- VAT / tax
- Check local VAT and excise rules for the import destination.
- Unit / basis
- Not listed in this tariff line
- Source / vintage
- Dubai Customs HSCodeMaster v3.3, worksheet HSCodeMaster, row 12765
Customs Duty
0 %
Import permission
not assessed
Import planning
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Details
- HS Code
- 903190100000
- Chapter
- 90 —
- Heading
- 9031
- Subheading
- 903190
Compare HS code 903190100000 across GCC countries
Each destination shows its own source label. Oman uses its national schedule; Qatar and UAE entries may cite their separately published references and unresolved exceptions. Other entries retain the historical GCC reference. National codes, duty notes, restrictions and tax treatment can differ; verify with the destination customs authority.
Related HS Codes (Heading 9031)
| HS Code | Description | Duty |
|---|---|---|
| 903110000000 | Centrifugal balancing machines designed for balancing flexible rotors having a length of 600 mm or more (capable of balancing speed of revolution greater than 5000 rpm) | 5 %Dubai Customs published reference |
| 903110000001 | Centrifugal balancing machines designed for balancing flexible rotors having a length of 600 mm or more (capable of balancing speed of revolution greater than 5000 rpm) | 5 %Historical GCC reference · not nationally verified |
| 903110000002 | Centrifugal balancing machines designed for balancing hollow cylindrical rotor components (having capability of from 0.9 to 23 kg) | 5 %Historical GCC reference · not nationally verified |
| 903110009999 | Other | 5 %Historical GCC reference · not nationally verified |
| 903120000000 | - Test benches | 5 %Dubai Customs published reference |
| 903141000000 | -- For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | 0 %Dubai Customs published reference |
| 903149100000 | - - - Optical instruments for measuring particle surface pollution on semiconductor wafers | 0 %Dubai Customs published reference |
| 903149200000 | - - -Measuring instruments for dimensional inspection computer controlled or numerically controlled having only two axes and having a maximum permissible error of length measurement along any axis (one dimensional) | ExemptedHistorical GCC reference · not nationally verified |
| 903149300000 | - - -Measuring systems containing a laser (with a resolution over their full scale of 0.1 µm or better and capable of maintaining for at least 12 h) | ExemptedHistorical GCC reference · not nationally verified |
| 903149900000 | - - - Other | 0 %Dubai Customs published reference |
| 903180100000 | - - - Appliances for checking and adjusting motor vehicle engines | 5 %Dubai Customs published reference |
| 903180200000 | - - - Electronic beams microscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and rectiles | 0 %Dubai Customs published reference |
| 903180300000 | - - -Electrodynamic vibration test systems employing feedback or closed loop control techniques and incorporating a digital control unit | ExemptedHistorical GCC reference · not nationally verified |
| 903180400000 | - - -Velocity interferometers for measuring velocities exceeding 1 km/s during time intervals of less than 10 µs | ExemptedHistorical GCC reference · not nationally verified |
| 903180900000 | Linear displacement measuring instruments containing non-contact type measuring systems (with a resolution equal to or better than 0.2 µm) | 5 %Dubai Customs published reference |
| 903180900001 | Linear displacement measuring instruments containing non-contact type measuring systems (with a resolution equal to or better than 0.2 µm) | 5 %Historical GCC reference · not nationally verified |
| 903180900002 | Linear displacement measuring instruments for linear variable differential transformer systems with an operating range up to 5 mm | 5 %Historical GCC reference · not nationally verified |
| 903180900003 | Angular displacement measuring systems for angular displacement having an angular position deviation equal to or less than 0.00025°. | 5 %Historical GCC reference · not nationally verified |
| 903180900004 | Measuring systems for results of measuring simultaneous linear-angular inspection for semi shells systems (having measurement uncertainty along any linear axis equal to or less than 3.5 µm per 5 mm and angular position deviation equal to or less than 0.02°) | 5 %Historical GCC reference · not nationally verified |
| 903180909999 | Other | 5 %Historical GCC reference · not nationally verified |
Data source: Dubai Customs HSCodeMaster v3.3 reference; national exceptions and declaration rules require confirmation. Historical reference rates exclude VAT, excise and other national measures. Separate national entries preserve the columns printed by their source; these are not a complete shipment assessment. Full disclaimer.