United Arab Emirates Customs Tariff for HS Code 903180200000
- - - Electronic beams microscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and rectiles
- - - ميكروسكوبات (مجاهر) الحزم الإليكترونية مزودة بأجهزة معدة خصيصا لمناولة ونقل الأقراص الرقيقة والشبيكات من أشباه الموصلات
Direct HS code answer for United Arab Emirates
United Arab Emirates HS Code 903180200000: Exempted
The reference dataset lists a duty value of Exempted for - - - Electronic beams microscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and rectiles. Import permission is not assessed. Verify the exact national tariff line, origin treatment, taxes, restrictions, and current customs guidance before using this information in a declaration.
Customs tariff summary
- Country
- United Arab Emirates
- HS / tariff code
- 903180200000
- Description
- - - - Electronic beams microscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and rectiles
- Chapter
- 90 —
- Heading
- 9031
- Subheading
- 903180
- Reference duty value
- Exempted
- VAT / tax
- Check local VAT and excise rules for the import destination.
- Unit / basis
- Not listed in this tariff line
- Source / vintage
- GCC Integrated Tariff reference published by ZATCA
Customs Duty
Exempted
معفاة
Import permission
not assessed
Import planning
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Details
- HS Code
- 903180200000
- Chapter
- 90 —
- Heading
- 9031
- Subheading
- 903180
Compare HS code 903180200000 across GCC countries
These GCC pages currently use the same GCC Integrated Tariff reference published by ZATCA. They are not six independently reconciled national schedules. National codes, duty notes, restrictions, and tax treatment can differ; verify with the destination customs authority.
Related HS Codes (Heading 9031)
| HS Code | Description | Duty |
|---|---|---|
| 903110000001 | Centrifugal balancing machines designed for balancing flexible rotors having a length of 600 mm or more (capable of balancing speed of revolution greater than 5000 rpm) | 5 % |
| 903110000002 | Centrifugal balancing machines designed for balancing hollow cylindrical rotor components (having capability of from 0.9 to 23 kg) | 5 % |
| 903110009999 | Other | 5 % |
| 903120000000 | - Test benches | 5 % |
| 903141000000 | -- For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Exempted |
| 903149100000 | - - - Optical instruments for measuring particle surface pollution on semiconductor wafers | Exempted |
| 903149200000 | - - -Measuring instruments for dimensional inspection computer controlled or numerically controlled having only two axes and having a maximum permissible error of length measurement along any axis (one dimensional) | Exempted |
| 903149300000 | - - -Measuring systems containing a laser (with a resolution over their full scale of 0.1 µm or better and capable of maintaining for at least 12 h) | Exempted |
| 903149900000 | - - - Other | Exempted |
| 903180100000 | - - - Appliances for checking and adjusting motor vehicle engines | 5 % |
| 903180300000 | - - -Electrodynamic vibration test systems employing feedback or closed loop control techniques and incorporating a digital control unit | Exempted |
| 903180400000 | - - -Velocity interferometers for measuring velocities exceeding 1 km/s during time intervals of less than 10 µs | Exempted |
| 903180900001 | Linear displacement measuring instruments containing non-contact type measuring systems (with a resolution equal to or better than 0.2 µm) | 5 % |
| 903180900002 | Linear displacement measuring instruments for linear variable differential transformer systems with an operating range up to 5 mm | 5 % |
| 903180900003 | Angular displacement measuring systems for angular displacement having an angular position deviation equal to or less than 0.00025°. | 5 % |
| 903180900004 | Measuring systems for results of measuring simultaneous linear-angular inspection for semi shells systems (having measurement uncertainty along any linear axis equal to or less than 3.5 µm per 5 mm and angular position deviation equal to or less than 0.02°) | 5 % |
| 903180909999 | Other | 5 % |
| 903190100000 | - - - Parts and accessories for inspecting semiconductor wafers optical instruments or devices or for inspecting semiconductor masks, photomasks or reticles used in the manufacturing of semiconductor devices | Exempted |
| 903190200000 | - - - Parts and accessories for stroboscopes fitted with instruments of a kind used specially for handling and transporting semiconductor wafers and reticles | Exempted |
| 903190300000 | - - - Parts and accessories for measuring particle surface pollution optical instruments on semiconductor wafers | Exempted |
Data source: GCC Integrated Tariff reference published by ZATCA. This common GCC reference has not been independently reconciled against the destination country's national system. Rates do not include VAT, excise, trade-remedy duties, origin-based preferences, or other national measures. Full disclaimer.